Editor in Chief

• Dorgham, M.A., International Centre for Technology and Management, UK
  (editorialinderscience.com)

Associate Editors

• Brna, Paul, University of Edinburgh, UK
• Dicheva, Darina, Winston-Salem State University, USA
• Ewing, Bradley T., Texas Tech University, USA
• Eyerer, Peter, Fraunhofer Institut für Chemische Technologie (ICT), Germany
• Vassileva, Julita, University of Saskatchewan, Canada
• Wang, Qiyun, Nanyang Technological University, Singapore

Editorial Board Members

• Abas, Wan Abu Bakar Wan, Universiti Malaya, Malaysia
• Ali, Moonis, Texas State University, USA
• Allen, Geoffrey, Unilever Research and Engineering, UK
• Anderson, Robert, General Electric Co, USA
• Birge, John R., University of Chicago, USA
• Brann, William, Motorola Inc, USA
• Casali, John G., Virginia Polytechnic Institute and State University, USA
• Chen, Jacob Jen-Gwo, Foxconn (Hon Hai) Technology Group, USA
• Constantinou, Costas, University of Cyprus, Cyprus
• El Maslout, Abdallah, Ministère de l’Education Nationale, Morocco
• Encarnação, José L., Fraunhofer Institut Graphische Datenverarbeit, Germany
• Fan, Kuang-Chao, National Taiwan University, Taiwan, ROC
• Gosling, John W., ESKOM, South Africa
• Harada, Kosaka, Japanese Society of Engineering Education, Japan
• House, Charles H., Hewlett-Packard Co, USA
• Jiping, Zhang, East China Normal University, China
• Kinshuk, , Athabasca University, Canada
• Kirschner, P.A., Open University of the Netherlands, Netherlands
• Kursted, Harold, Virginia Tech, USA
• Lin, Grier, University of South Australia, Australia
• Luo, Ren. C., National Taiwan University, Taiwan, ROC
• Marcum, J.M., European Institute of Technology, Italy
• McKay, Elspeth, RMIT University, Australia
• McKenzie, J., Institution of Civil Engineers, UK
• Mustajaervi, Jari, Forssa Vocational Adult Education Centre, Finland
• Ohnsorge, H., Alcatel Group, France
• Ponsoda, Vicente, Universidad Autonoma de Madrid, Spain
• Skibniewski, Miroslaw J., University of Maryland, USA
• Slettenhaar, H.K. (Dick), University of Twente, Netherlands
• Thesen, Arne, University of Wisconsin–Madison, USA
• Tien, James M., Rensselaer Polytechnic Institute , USA
• Wallenius, Jyrki, Aalto University School of Business, Finland
• Yongxiang, Lu, Chinese Academy of Sciences (CAS), China

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