Editors

• Allahverdi, Ali, Gazi University, Turkey
  (aliallahverdigazi.edu.tr)
• Framinan, Jose M., University of Seville, Spain
  (framinanus.es)
• Moon, Ilkyeong, Seoul National University, South Korea
  (ikmoonsnu.ac.kr)
• Ruiz García, Rubén, Universidad Politecnica de Valencia, Spain
  (rruizeio.upv.es)

Associate Editors

• Cannella, Salvatore, University of Catania, Italy
• Chung, Byung Do, Yonsei University, South Korea
• Eren, Tamer, Kirikkale University, Turkey
• Feng, Xuehao, Zhejiang University, China
• Hsu, Chia-Yu, National Taipei University of Technology, Taiwan, Province of China
• Iris, Cagatay, University of Liverpool, UK
• Kim, Byung Soo, Incheon National University, South Korea
• Mönch, Lars, FernUniversität Hagen, Germany
• Moon, Seung Ki, Nanyang Technological University, Singapore
• Nielsen, Izabela Ewa, Aalborg University, Denmark
• Park, You-Jin, National Taipei University of Technology, Taiwan, Province of China
• Sarkar, Biswajit, Yonsei University, South Korea
• Tierney, Kevin, Bielefeld University, Germany
• Weng, Jiahua, Kanagawa University, Japan

Editorial Board Members

• Alvarez-Valdes, Ramon, University of Valencia, Spain
• Andrés Romano, Carlos, Universidad Politécnica de Valencia, Spain
• Artigues, Christian, Université de Toulouse, France
• Austin, Robert D., Harvard University, USA
• Aydin, Mehmet E., University of the West of England, UK
• Barnes, John W., The University of Texas at Austin, USA
• Baykasoglu, Adil, Dokuz Eylul University, Turkey
• Bertsch, Valentin, Trinity College Dublin, Ireland
• Cárdenas-Barrón, Leopoldo Eduardo, Instituto Tecnológico y de Estudios Superiores de Monterrey, Mexico
• Caridi, Maria, Politecnico di Milano, Italy
• Chatfield, Dean C., Old Dominion University, USA
• Ciavotta, Michele, Instituto Tecnolôgico de Informâtica, Spain
• Corsini, Roberto Rosario, University of Catania, Italy
• Demeulemeester, Erik, Katholieke Universiteit Leuven, Belgium
• Dullaert, Wout, Vrije Universiteit Amsterdam, Belgium
• Gao, Liang, Huazhong University of Science and Technology, China
• Geldermann, Jutta, Universität Duisburg-Essen, Germany
• Goldsman, David, Georgia Institute of Technology, USA
• Haouari, Mohamed, Qatar University, Qatar
• Heragu, Sunderesh S., Oklahoma State University , USA
• Hong, I-Hsuan, National Taiwan University, Taiwan, Province of China
• Juan, Angel A., Universitat Politècnica de València, Spain
• Khoo, Michael B.C., Universiti Sains Malaysia, Malaysia
• Knust, Sigrid, Universität Osnabrück, Germany
• Kovács, András, MTA SZTAKI, Hungary
• Laporte, Gilbert, HEC Montréal, Canada
• Lau, Henry Y.K., University of Hong Kong, Hong Kong SAR, China
• Malmborg, Charles J., Rensselaer Polytechnic Institute, USA
• Medaglia, Andrés L., Universidad de los Andes, Colombia
• Montgomery, Douglas C., Arizona State University, USA
• Park, Woojin, Seoul National University, South Korea
• Röder, Axel, DaimlerChrysler AG, Germany
• Rajendran, Chandrasekharan, Indian Institute of Technology Madras, India
• Riezebos, Jan, University of Groningen, Netherlands
• Sánchez Galdón, Ana Isabel, Universidad Politécnica de Valencia, Spain
• Słowiński, Roman, Poznan University of Technology, Poland
• Saha, Subrata, University of Engineering and Management (UEM), Kolkata, India
• Schaller, Jeffrey, Easter Connecticut State University, USA
• Schuster, Christoph, Bayer Business Services GmbH, Germany
• Sivrikaya-Şerifoğlu, Funda, Düzce University, Turkey
• Song, Wheyming Tina, National Tsing Hua University, Taiwan, Province of China
• Stützle, Thomas, Université Libre de Bruxelles, Belgium
• Taleizadeh, Ata Allah, University of Tehran, Iran
• Tavakkoli-Moghaddam, Reza, University of Tehran, Iran
• Valente, Jorge M.S., Universidade do Porto, Portugal
• Villa, Gabriel, Universidad de Sevilla, Spain
• Węglarz, Jan, Poznan University of Technology, Poland
• Wilck, Joseph, University of Tennessee, USA
• Yih, Yuehwern, Purdue University, USA
• Zhang, Ruiyou, Northeastern University, China

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