Editor in Chief

• Dana, Leo Paul, Montpellier Business School, France
  (lp.danamontpellier-bs.com)

Associate Editors

• Brahmi, Mohsen, IAE Southern Campus and FEM. S. University, Tunisia
• Ramadani, Veland, South-East European University, Macedonia, F.Y.R.
• Ratten, Vanessa, La Trobe University, Australia
• Vang, Jan, Aalborg University, Denmark

European Editor

• Rouach, Daniel, ESCP Europe, Germany

Editorial Board Members

• Acheampong, George, University of Ghana, Ghana
• Andrade, Herlandí de Souza, Centro Estadual de Educação Tecnológica Paula Souza,, Brazil
• Audretsch, David B., Indiana University, USA
• Bidault, Francis, Theseus International Management Institute, France
• Birley, Sue, Imperial College, UK
• Culasso, Francesca, University of Turin, Italy
• Eisenhardt, Kathy, Stanford University, USA
• Eyerer, Peter, Fraunhofer Institut für Chemische Technologie (ICT), Germany
• Farber, David J., Carnegie Mellon University, USA
• Geisler, Eliezer, Illinois Institute of Technology, USA
• Georghiou, Luke, University of Manchester, UK
• Giacosa, Elisa, University of Turin, Italy
• Howells, Jeremy, University of Southampton, UK
• Jain, P.K., Indian Institute of Technology, India
• Jain, Ravi, University of the Pacific, USA
• Joshi, Manoj, Amity University, India
• Kierkegaard, Sylvia Mercado, International Association of IT Lawyers, Denmark
• Kovac, Ivana, University of Zagreb, Croatia
• Krattiger, Anatole F., Cornell University, USA
• Kumar, Vimal, Ministry of Science and Technology, India
• Liang, Dan, UNIDO Investment and Technology Promotion, Austria
• Munroe, Tapan, Munroe Consulting, Inc, USA
• Musits, Bela L., Clarkson University, USA
• Mytelka, Lynn K., , France
• Novak, Ivan, University of Zagreb, Croatia
• Obhodjas, Ibrahim, University Vitez Travnik, Bosnia and Herzegovina
• Ohkita, Kenichi, Aichi University, Japan
• Peris Ortiz, Marta, Universidad Politècnica de Valencia, Spain
• Premus, Robert, Wright-State University Rike Hall, USA
• Rexhepi, Gadaf, South East European University, Macedonia, F.Y.R.
• Van Maanen, John, Massachusetts Institute of Technology, USA
• Vernon, John M., Duke University, USA

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