Editor in Chief

• Patnaik, Srikanta, Interscience Institute of Management and Technology, Bhubaneswar, India
  (patnaik_srikantayahoo.co.in)

Associate Editor

• Dong, Na, Tianjin University, China

Editorial Board Members

• Bendjenna, Hakim, University of Larbi Tebessi, Algeria
• Bhatia, Sanjiv K., University of Missouri - St. Louis, USA
• Chaudhuri, Debasis, Defence Electronics Applications Laboratory, India
• Damper, R.I., University of Southampton, UK
• DeSouza, Guilherme N., University of Western Australia, Australia
• Gini, Maria, University of Minnesota, USA
• Governi, Lapo, University of Florence, Italy
• Han, Wang, Nanyang Technological University, Singapore
• Hu, Junlin, Beihang University, China
• Jain, Mohit, Dell EMC, USA
• Koshizen, Takamasa, Honda Research Institute Japan Co. Ltd., Japan
• Kothari, Ravi, IBM Research - India, India
• Kountchev, Roumen Kirilov, Technical University of Sofia, Bulgaria
• Krim, Hamid, North Carolina State University, USA
• Lee, Chan-Su, Yeungnam University, South Korea
• Lima, Pedro U., University of Lisbon, Portugal
• Mata, Mario, Universidad Europea de Madrid, Spain
• Nahvi, Ali, K.N. Toosi University of Technology, Iran
• Ranjan, Jayanthi, Institute of Management Technology (IMT), India
• Rocha, Alvaro, University of Lisbon, Portugal
• Ruichek, Yassine, University of Technology of Belfort-Montbéliard, France
• Samal, Ashok, University of Nebraska-Lincoln, USA
• Sethi, Ishwar, Oakland University, USA
• Shafazand, M. Hassan, Shahid Bahonar University of Kerman, Iran
• Sharma, Rajeev, Pennsylvania State University, USA
• Sun, Yu, Michigan State University, USA
• Tan, Kok Kiong, National University of Singapore, Singapore
• Wren, Christopher R., Mitsubishi Electric Research Laboratories, USA
• Yang, Yeon-Mo, Kumoh National Institute of Technology, South Korea
• Yeasin, Mohammed, University of Memphis, USA
• Yezzi, Anthony, Georgia Institute of Technology, USA
• Yin, Peng-Yeng, Ming Chuan University, Taiwan, Province of China

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• All articles for this journal must be submitted using our online submissions system.
• View Author guidelines.
• Submit here.