International Journal of Technology Management (IJTM)

International Journal of Technology Management

2008 Vol.44 No.3/4

Special Issue on Developing Capabilities for Continuous Innovation

Guest Editors: Prof. John Bessant and Dr. David Francis

Editorial

Pages Title and author(s)
298-323Developing an organisation culture to facilitate radical innovation
Patrick McLaughlin, John Bessant, Palie Smart
DOI: 10.1504/IJTM.2008.021041
324-337Key factors in small group improvement work: an empirical study at SKF
Mats G. Magnusson, Emanuele Vinciguerra
DOI: 10.1504/IJTM.2008.021042
338-353Continuous innovative practises and operational performance
Bjorge Timenes Laugen, Harry Boer
DOI: 10.1504/IJTM.2008.021043
354-372Operational effectiveness and strategic flexibility: scales for performance assessment of new product development systems
Petra C. De Weerd-Nederhof, Klaasjan Visscher, Jelmer Altena, Olaf A.M. Fisscher
DOI: 10.1504/IJTM.2008.021044
373-390Outsourcing manufacturing and its effect on engineering firm performance
Lars Bengtsson
DOI: 10.1504/IJTM.2008.021045
391-405The extraction of manufacturing capability: a case of sophisticated transferee
Jonathan Sapsed, Ammon J. Salter
DOI: 10.1504/IJTM.2008.021046
406-426When technology innovation is not enough, new competitive paradigms, revisiting the Spanish ceramic tile sector
Jose Albors-Garrigos, Jose Luis Hervas-Oliver, Patricia Beatriz Marquez
DOI: 10.1504/IJTM.2008.021047
427-440CI in the work place: does involving the HRM function make any difference?
Paul Hyland, Karen Becker, Terry Sloan, Frances Jorgensen
DOI: 10.1504/IJTM.2008.021048
441-460Organising for continuous innovation: the community of practice approach
Mariano Corso, Antonella Martini, Raffaello Balocco
DOI: 10.1504/IJTM.2008.021049
461-479Organisational learning in the new product development process: findings from three case studies in Brazilian manufacturing companies
Marcelo Ruy, Dario Henrique Alliprandini
DOI: 10.1504/IJTM.2008.021050
480-485Book Review: The Secret of GE's Success by William E. Rothschild
Pier A. Abetti
DOI: 10.1504/IJTM.2008.021051

 

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