
International Journal of Materials and Product Technology
2006 Vol.25 No.1/2/3
Special Issue on Reliability and Safety
Guest Editor: Professor Zissimos P. Mourelatos
Pages | Title and author(s) |
3-26 | On reliability-based optimisation methods for automotive structuresLei Gu, R.J. Yang DOI: 10.1504/IJMPT.2006.008271 |
27-41 | A new study on optimisation under uncertainty for vehicle designYan Fu DOI: 10.1504/IJMPT.2006.008272 |
42-63 | Influence of interval censoring and bias on injury risk curve developmentRichard F. Banglmaier, Lan Wang, Priya Prasad DOI: 10.1504/IJMPT.2006.008273 |
64-83 | Fatigue reliability of structural componentsHieronim Jakubczak, Wojciech Sobczykiewicz, Grzegorz Glinka DOI: 10.1504/IJMPT.2006.008274 |
84-98 | Adaptive trust regions and response surfaces for reliability analysisTong Zou, Sankaran Mahadevan, Zissimos P. Mourelatos DOI: 10.1504/IJMPT.2006.008275 |
99-111 | Two-level approximation method for reliability-based design optimisationHae Chang Gea, Kunjal Oza DOI: 10.1504/IJMPT.2006.008276 |
112-126 | Reliability based optimisation of engineering structures under imprecise informationHa-Rok Bae, Ramana V. Grandhi, Robert A. Canfield DOI: 10.1504/IJMPT.2006.008277 |
127-143 | Robust design of mechanical systems via stochastic expansionSeung-Kyum Choi, Ramana V. Grandhi, Robert A. Canfield DOI: 10.1504/IJMPT.2006.008278 |
144-163 | The role of nondeterminism in model verification and validationBen H. Thacker, Mark C. Anderson, Paul E. Senseny, Edward A. Rodriguez DOI: 10.1504/IJMPT.2006.008279 |
164-181 | Statistical validation of simulation modelsRamesh Rebba, Shuping Huang, Yongming Liu, Sankaran Mahadevan DOI: 10.1504/IJMPT.2006.008280 |
182-197 | Stochastic design using cross-validated nonparametric meta-modelling techniquesJian Tu, Yi-Pen Cheng DOI: 10.1504/IJMPT.2006.008281 |
198-210 | Uniform design for computer experiments and its optimal propertiesKai-Tai Fang, Runze Li DOI: 10.1504/IJMPT.2006.008282 |
211-230 | Uncertainty and risk in aircraft structures: current status and recommended directionsChris L. Pettit DOI: 10.1504/IJMPT.2006.008283 |
231-239 | Step-stress accelerated testMing-Wei Lu, Jeffrey E Leiman, Richard J. Rudy, Yung-Li Lee DOI: 10.1504/IJMPT.2006.008284 |