International Journal of Materials and Product Technology (IJMPT)

International Journal of Materials and Product Technology

2006 Vol.25 No.1/2/3

Special Issue on Reliability and Safety

Guest Editor: Professor Zissimos P. Mourelatos


Pages Title and author(s)
3-26On reliability-based optimisation methods for automotive structures
Lei Gu, R.J. Yang
DOI: 10.1504/IJMPT.2006.008271
27-41A new study on optimisation under uncertainty for vehicle design
Yan Fu
DOI: 10.1504/IJMPT.2006.008272
42-63Influence of interval censoring and bias on injury risk curve development
Richard F. Banglmaier, Lan Wang, Priya Prasad
DOI: 10.1504/IJMPT.2006.008273
64-83Fatigue reliability of structural components
Hieronim Jakubczak, Wojciech Sobczykiewicz, Grzegorz Glinka
DOI: 10.1504/IJMPT.2006.008274
84-98Adaptive trust regions and response surfaces for reliability analysis
Tong Zou, Sankaran Mahadevan, Zissimos P. Mourelatos
DOI: 10.1504/IJMPT.2006.008275
99-111Two-level approximation method for reliability-based design optimisation
Hae Chang Gea, Kunjal Oza
DOI: 10.1504/IJMPT.2006.008276
112-126Reliability based optimisation of engineering structures under imprecise information
Ha-Rok Bae, Ramana V. Grandhi, Robert A. Canfield
DOI: 10.1504/IJMPT.2006.008277
127-143Robust design of mechanical systems via stochastic expansion
Seung-Kyum Choi, Ramana V. Grandhi, Robert A. Canfield
DOI: 10.1504/IJMPT.2006.008278
144-163The role of nondeterminism in model verification and validation
Ben H. Thacker, Mark C. Anderson, Paul E. Senseny, Edward A. Rodriguez
DOI: 10.1504/IJMPT.2006.008279
164-181Statistical validation of simulation models
Ramesh Rebba, Shuping Huang, Yongming Liu, Sankaran Mahadevan
DOI: 10.1504/IJMPT.2006.008280
182-197Stochastic design using cross-validated nonparametric meta-modelling techniques
Jian Tu, Yi-Pen Cheng
DOI: 10.1504/IJMPT.2006.008281
198-210Uniform design for computer experiments and its optimal properties
Kai-Tai Fang, Runze Li
DOI: 10.1504/IJMPT.2006.008282
211-230Uncertainty and risk in aircraft structures: current status and recommended directions
Chris L. Pettit
DOI: 10.1504/IJMPT.2006.008283
231-239Step-stress accelerated test
Ming-Wei Lu, Jeffrey E Leiman, Richard J. Rudy, Yung-Li Lee
DOI: 10.1504/IJMPT.2006.008284