International Journal of Precision Technology
2013 Vol.3 No.3
Special Issue on Surfaces and Their Measurement – Part 1
Guest Editor: Professor David J. Whitehouse
Editorial |
Pages | Title and author(s) |
223-243 | Some issues in surface and form metrologyDavid J. Whitehouse DOI: 10.1504/IJPTECH.2013.057051 |
244-260 | Lifting wavelet algorithm for freeform surface filtering using a Gaussian prediction operatorX. Jiang; H.S. Abdul-Rahman; P.J. Scott DOI: 10.1504/IJPTECH.2013.057052 |
261-276 | Advanced characterisation methodology for engineered surfacesRitwik Verma; Jay Raja DOI: 10.1504/IJPTECH.2013.057053 |
277-289 | Controllable fabrication of freeform opticsX.D. Zhang; Q.C. Wang; F.Z. Fang; X.L. Liu DOI: 10.1504/IJPTECH.2013.057054 |
290-302 | Correlation of micro and nano-scale defects with WVTR for aluminium oxide barrier coatings for flexible photovoltaic modulesL. Blunt; M. Elrawemi; L. Fleming; F. Sweeney DOI: 10.1504/IJPTECH.2013.057055 |
303-313 | Selection of metrology and manufacturing process for a functional surfaceS.K. Ramasamy; J. Raja; H. Peruru DOI: 10.1504/IJPTECH.2013.057056 |