International Journal of Precision Technology (IJPTech)

International Journal of Precision Technology

2013 Vol.3 No.3

Special Issue on Surfaces and Their Measurement – Part 1

Guest Editor: Professor David J. Whitehouse


Pages Title and author(s)
223-243Some issues in surface and form metrology
David J. Whitehouse
DOI: 10.1504/IJPTECH.2013.057051
244-260Lifting wavelet algorithm for freeform surface filtering using a Gaussian prediction operator
X. Jiang; H.S. Abdul-Rahman; P.J. Scott
DOI: 10.1504/IJPTECH.2013.057052
261-276Advanced characterisation methodology for engineered surfaces
Ritwik Verma; Jay Raja
DOI: 10.1504/IJPTECH.2013.057053
277-289Controllable fabrication of freeform optics
X.D. Zhang; Q.C. Wang; F.Z. Fang; X.L. Liu
DOI: 10.1504/IJPTECH.2013.057054
290-302Correlation of micro and nano-scale defects with WVTR for aluminium oxide barrier coatings for flexible photovoltaic modules
L. Blunt; M. Elrawemi; L. Fleming; F. Sweeney
DOI: 10.1504/IJPTECH.2013.057055
303-313Selection of metrology and manufacturing process for a functional surface
S.K. Ramasamy; J. Raja; H. Peruru
DOI: 10.1504/IJPTECH.2013.057056