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International Journal of Precision Technology
Published issues
2011 Vol.2 No.2/3
International Journal of Precision Technology
2011 Vol.2 No.2/3
Special Issue on Precision Metrology
Guest Editor
: Professor Albert Weckenmann
Editorial
Pages
Title and author(s)
118-135
Dimensional metrology for process and part quality control in micro manufacturing
Hans Norgaard Hansen, Guido Tosello, Stefania Gasparin, Leonardo De Chiffre
DOI
:
10.1504/IJPTECH.2011.039455
136-152
Large scale atomic force microscopy for characterisation of optical surfaces and coatings
S. Sturwald, R. Schmitt
DOI
:
10.1504/IJPTECH.2011.039456
153-171
Metrological performance verification of coordinate measuring systems with optical distance sensors
Simone Carmignato, Enrico Savio
DOI
:
10.1504/IJPTECH.2011.039457
172-191
Identification and classification of defects on highly reflective textile machinery ring components
R.B. Abraham, P.S. Sonakar, M. Singaperumal, B. Ramamoorthy
DOI
:
10.1504/IJPTECH.2011.039458
192-210
Influence of feature form deviations on CMM measurement uncertainties
Nick Van Gestel, Philip Bleys, Frank Welkenhuyzen, Jean-Pierre Kruth
DOI
:
10.1504/IJPTECH.2011.039459
211-225
Precision measurement of micro-lens profile by using a force-controlled diamond cutting tool on an ultra-precision lathe
K.W. Lee, Y.J. Noh, Y. Arai, Y. Shimizu, W. Gao
DOI
:
10.1504/IJPTECH.2011.039460
226-245
Task specific uncertainty estimation in dimensional metrology
Han Haitjema
DOI
:
10.1504/IJPTECH.2011.039461
246-265
Phase feedback fibre interferometer for surface profiling
X. Jiang, H. Martin
DOI
:
10.1504/IJPTECH.2011.039462
266-288
Application of modern high resolution tactile sensors for micro-objects
A. Weckenmann, A. Schuler
DOI
:
10.1504/IJPTECH.2011.039463
289-300
Control of AFM tip wear
Francesco Marinello, Enrico Savio, Leonardo De Chiffre
DOI
:
10.1504/IJPTECH.2011.039464
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