International Journal of Precision Technology (IJPTech)

International Journal of Precision Technology

2011 Vol.2 No.2/3

Special Issue on Precision Metrology

Guest Editor: Professor Albert Weckenmann


Pages Title and author(s)
118-135Dimensional metrology for process and part quality control in micro manufacturing
Hans Norgaard Hansen, Guido Tosello, Stefania Gasparin, Leonardo De Chiffre
DOI: 10.1504/IJPTECH.2011.039455
136-152Large scale atomic force microscopy for characterisation of optical surfaces and coatings
S. Sturwald, R. Schmitt
DOI: 10.1504/IJPTECH.2011.039456
153-171Metrological performance verification of coordinate measuring systems with optical distance sensors
Simone Carmignato, Enrico Savio
DOI: 10.1504/IJPTECH.2011.039457
172-191Identification and classification of defects on highly reflective textile machinery ring components
R.B. Abraham, P.S. Sonakar, M. Singaperumal, B. Ramamoorthy
DOI: 10.1504/IJPTECH.2011.039458
192-210Influence of feature form deviations on CMM measurement uncertainties
Nick Van Gestel, Philip Bleys, Frank Welkenhuyzen, Jean-Pierre Kruth
DOI: 10.1504/IJPTECH.2011.039459
211-225Precision measurement of micro-lens profile by using a force-controlled diamond cutting tool on an ultra-precision lathe
K.W. Lee, Y.J. Noh, Y. Arai, Y. Shimizu, W. Gao
DOI: 10.1504/IJPTECH.2011.039460
226-245Task specific uncertainty estimation in dimensional metrology
Han Haitjema
DOI: 10.1504/IJPTECH.2011.039461
246-265Phase feedback fibre interferometer for surface profiling
X. Jiang, H. Martin
DOI: 10.1504/IJPTECH.2011.039462
266-288Application of modern high resolution tactile sensors for micro-objects
A. Weckenmann, A. Schuler
DOI: 10.1504/IJPTECH.2011.039463
289-300Control of AFM tip wear
Francesco Marinello, Enrico Savio, Leonardo De Chiffre
DOI: 10.1504/IJPTECH.2011.039464