International Journal of Manufacturing Technology and Management (IJMTM)

International Journal of Manufacturing Technology and Management

2000 Vol.1 No.2/3

Pages Title and author(s)
147-155Interbay Automated Material Handling System stocker design for wafer fabrication facilities
Chiahung J. Lin, Taho Yang, Jose M. Padillo, Debbie Beres
DOI: 10.1504/IJMTM.2000.001344
156-172A genetic algorithm approach to manage ion implantation processes in wafer fabrication
Shwu-Min Horng, John W. Fowler, Jeffery K. Cochran
DOI: 10.1504/IJMTM.2000.001339
173-184A laboratory infrastructure for flexible automation and integrated manufacturing research
F. Frank Chen, Can Saygin
DOI: 10.1504/IJMTM.2000.001337
185-194The design issues of resource management information systems
Benjamin Ping-Chang Yen
DOI: 10.1504/IJMTM.2000.001346
195-217MR-IE: an enterprise integration reference model for CIMS implementation
Yuan-Chen Yu
DOI: 10.1504/IJMTM.2000.001347
218-231The performance of multiple-load AGV systems under different guide path configurations and vehicle control strategies
Ying-Chin Ho, Han-Chi Shaw
DOI: 10.1504/IJMTM.2000.001338
232-240Production smoothing and buffer stock reduction for two-stage production and inventory systems
Kazuyoshi Ishii, Shusaku Hiraki
DOI: 10.1504/IJMTM.2000.001343
241-256Evaluating ROBOTIC safety using quality function deployment
Yung-Nien Yang, Hamid R. Parsaei, Herman R. Leep, Kosin Chuengsatiansup
DOI: 10.1504/IJMTM.2000.001345
257-270Promoting technological capabilities of small and medium-sized enterprises through industry-university cooperation: case study of Taiwan machine tool industry
Wen-Shiow Hsu, Pao-Long Chang
DOI: 10.1504/IJMTM.2000.001342
271-287Grey relation pattern recogniser for X-bar control charts
Hsi-Mei Hsu, Yan-Kwang Chen
DOI: 10.1504/IJMTM.2000.001341
288-317Enhancing the effectiveness of lean clustering in establishing benchmarks for automatic classification systems
T.C. Hsia, S.H. Hsu, W.Y. Huang, M.C. Wu
DOI: 10.1504/IJMTM.2000.001340
318-327A bottleneck-based due-date assignment methodology
Yu-Jen Chang, Ching-En Lee
DOI: 10.1504/IJMTM.2000.001336