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International Journal of Precision Technology

2013 Vol. 3 No. 3

Special Issue on Surfaces and Their Measurement Part 1

Guest Editor: Professor David J. Whitehouse


PagesTitle and authors
223-243Some issues in surface and form metrology
David J. Whitehouse
DOI: 10.1504/IJPTECH.2013.057051

244-260Lifting wavelet algorithm for freeform surface filtering using a Gaussian prediction operator
X. Jiang; H.S. Abdul-Rahman; P.J. Scott
DOI: 10.1504/IJPTECH.2013.057052

261-276Advanced characterisation methodology for engineered surfaces
Ritwik Verma; Jay Raja
DOI: 10.1504/IJPTECH.2013.057053

277-289Controllable fabrication of freeform optics
X.D. Zhang; Q.C. Wang; F.Z. Fang; X.L. Liu
DOI: 10.1504/IJPTECH.2013.057054

290-302Correlation of micro and nano-scale defects with WVTR for aluminium oxide barrier coatings for flexible photovoltaic modules
L. Blunt; M. Elrawemi; L. Fleming; F. Sweeney
DOI: 10.1504/IJPTECH.2013.057055

303-313Selection of metrology and manufacturing process for a functional surface
S.K. Ramasamy; J. Raja; H. Peruru
DOI: 10.1504/IJPTECH.2013.057056