Effect of measurement errors on the VSI X chart
by XueLong Hu; Philippe Castagliola; JinSheng Sun; Michael Boon Chong Khoo
European J. of Industrial Engineering (EJIE), Vol. 10, No. 2, 2016

Abstract: Measurement errors often exist in quality control applications. In this paper, the performance of the variable sampling interval (VSI) X chart is investigated when measurement errors exist using a linearly covariate error model. It is shown that the performance of the VSI X chart is significantly affected by the presence of measurement errors. The effect of taking multiple measurements, for each item in a subgroup, on the performance of VSI X chart is also investigated in this paper. An example is provided in order to illustrate the application of the VSI X chart with measurement errors. [Received 15 October 2014; Revised 9 February 2015; Accepted 1 August 2015]

Online publication date: Sat, 09-Apr-2016

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