Title: Effect of measurement errors on the VSI X chart

Authors: XueLong Hu; Philippe Castagliola; JinSheng Sun; Michael Boon Chong Khoo

Addresses: School of Automation, Nanjing University of Science and Technology, Nanjing, China ' LUNAM Université, Université de Nantes and IRCCyN UMR CNRS 6597, Nantes, France ' School of Automation, Nanjing University of Science and Technology, Nanjing, China ' School of Mathematical Sciences, Universiti Sains Malaysia, Malaysia

Abstract: Measurement errors often exist in quality control applications. In this paper, the performance of the variable sampling interval (VSI) X chart is investigated when measurement errors exist using a linearly covariate error model. It is shown that the performance of the VSI X chart is significantly affected by the presence of measurement errors. The effect of taking multiple measurements, for each item in a subgroup, on the performance of VSI X chart is also investigated in this paper. An example is provided in order to illustrate the application of the VSI X chart with measurement errors. [Received 15 October 2014; Revised 9 February 2015; Accepted 1 August 2015]

Keywords: measurement errors; average time to signal; ATS; standard deviation; SDTS; quality control; variable sampling interval; VSI X-bar charts; control charts; SPC; statistical process control.

DOI: 10.1504/EJIE.2016.075853

European Journal of Industrial Engineering, 2016 Vol.10 No.2, pp.224 - 242

Published online: 07 Apr 2016 *

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