A focused review on nanoscratching-induced deformation of monocrystalline silicon Online publication date: Tue, 05-Feb-2013
by Yueqin Wu; Han Huang; Jin Zou
International Journal of Surface Science and Engineering (IJSURFSE), Vol. 7, No. 1, 2013
Abstract: This focused review includes two parts. In the first part, the previous studies on the deformations of monocrystalline Si induced by nanoscratching were summarised. In the second part, our recent studies on the scratching-induced deformation of Si were systematically presented. The studies have demonstrated that lateral force in nanoscratching plays a key role in the amorphisation and phase transformation of Si under mechanical loading. The deformation route of Si appears to be different from those reported from the nanoindentation studies.
Online publication date: Tue, 05-Feb-2013
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Surface Science and Engineering (IJSURFSE):
Login with your Inderscience username and password:
Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.
If you still need assistance, please email firstname.lastname@example.org