Title: In-situ environmental scanning electron microscopy for probing the properties of advanced energy materials
Authors: Xing Li; Xianlong Wei; Qing Chen
Addresses: Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University, Beijing, 100871, China ' Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University, Beijing, 100871, China ' Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University, Beijing, 100871, China
Abstract: The unique properties of nanomaterials have made them potential candidates in energy applications. Due to the different structures and properties of nanomaterials, it is very important to study individual nanomaterials and correlate their properties to structures. In this review, we summarise in-situ electron microscopy methods for probing important properties of the nanomaterials for energy applications and their property-structure relationships, with an emphasis on those developed in our laboratory. Through the in-situ nanomanipulation conducted in a scanning electron microscope, the mechanical, electromechanical properties and photoelectronic properties of energy materials can be clarified and correlated to their structures. With the environmental atmosphere, electrochemical reactions occurred in batteries can be directly observed. Combined with the above measurements, the mechanical stability, mechanism and duration of the energy materials can be evaluated, based on which the performance of the materials can be improved and novel applications can be explored.
Keywords: in-situ SEM; scanning electron microscopy; property-structure relationship; electrochemical properties; electromechanical properties; photoelectronic properties; nanomaterials; lithium ion batteries; LIB; nanotechnology; environmental SEM; advanced energy materials.
International Journal of Nanomanufacturing, 2016 Vol.12 No.3/4, pp.264 - 277
Available online: 20 Sep 2016 *Full-text access for editors Access for subscribers Purchase this article Comment on this article