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Title: Synchrotron X-Ray diffraction analysis of cyclic deformation behaviour of thin gold films

Authors: S. Eve, A. Thuault, F. Hofmann, A.M. Korsunsky

Addresses: CRISMAT/CNRT-Materiaux/ENSICAEN, UMR 6508, UMS 3318, 6 Boulevard Marechal Juin 14050 Caen, France. ' CRISMAT/CNRT-Materiaux/ENSICAEN, UMR 6508, UMS 3318, 6 Boulevard Marechal Juin 14050 Caen, France. ' Department of Engineering Science, University of Oxford, Parks Rd, Oxford OX1 3PJ, UK. ' Department of Engineering Science, University of Oxford, Parks Rd, Oxford OX1 3PJ, UK

Abstract: Innovative micro-optical sensors involve metallic thin films deposited on polymer substrates. In the present study, we investigate in detail the state of macroscopic and microscopic stress that exists within thin gold films on polycarbonate substrate after deposition, and the evolution of these stresses during reversed in situ tensile testing and as a consequence of fatigue cycling.

Keywords: gold thin films; polymer substrate; cyclic behaviour; synchrotron X-Ray diffraction; deformation; micro-optical sensors; stress; tensile testing; fatigue cycling.

DOI: 10.1504/IJTAMM.2011.041172

International Journal of Theoretical and Applied Multiscale Mechanics, 2011 Vol.2 No.1, pp.38 - 45

Available online: 11 Jul 2011 *

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