Title: Identification and classification of defects on highly reflective textile machinery ring components

Authors: R.B. Abraham, P.S. Sonakar, M. Singaperumal, B. Ramamoorthy

Addresses: CAD Lab, MES, Sri Ranganthan Building, Department of Mechanical Engineering, IIT, Madras 60036, India; Kadavumbagum, Pulickal Kavala, Kottayam, Kerala, 686515, India. ' CAD Lab, MES, Sri Ranganthan Building, Department of Mechanical Engineering, IIT, Madras 60036, India; Gaurai Krupa #6, Doctor Colony, Gadhinglaj, Kolhapur, Maharashtra, 416502, India. ' MSB 312, PEIL, Department of Mechanical Engineering, IIT, Madras 60036, India; MSB 312, IIT Madras, Chennai, 600 036, India. ' MES 102, MES, Sri Ranganthan Building, Department of Mechanical Engineering, IIT, Madras 60036, India; MES 102, IIT Madras, Chennai, 600 036, India

Abstract: This paper deals with inspection and sorting of highly reflective chrome coated textile machinery rings using machine vision. To improve inspection speed and to ensure 100&#amp; quality inspection, it was absolutely essential to improve the complete inspection process and it was also required as well to classify defective and non-defective components by a proper sorting algorithm. In the present study, algorithm based on auto-median and single step thresholding approaches were used for defect detection and then their performances were compared with reference to efficiency of defect classification and speed. Bright field and dark field illumination have been used in the imaging setup. Once the defect detection and image segmentation is done the image details/data will be supplied to classification software. The description, analysis and the results of these techniques used in defect detection are reported and discussed in this paper.

Keywords: machine vision; auto-median; precision defect detection; dark field; pattern recognition; defect classification; reflective ring components; textile ring components; defect identification; textile machinery; chrome coatings; inspection speed; sorting; quality control; precision metrology; thresholding; ring component defects.

DOI: 10.1504/IJPTECH.2011.039458

International Journal of Precision Technology, 2011 Vol.2 No.2/3, pp.172 - 191

Published online: 06 Apr 2011 *

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