Title: ODMR studies of recombination emission in MPS3 layered semiconductors and their intercalation derivatives

Authors: E. Lifshitz, A.H. Francis

Addresses: Dept. of Chemistry and Solid State Institute, Technion, Haifa 32000, Israel. ' Dept. of Chemistry, The University of Michigan, Ann Arbor, MI 48109-1055, USA

Abstract: The semiconducting transition metals chalcogenophosphate (MPS3) crystallise in a layered structure. Under appropriate conditions ions and molecules with Lewis base character can enter the space between the layers to form intercalating compounds. These layered semiconductors and their intercalation derivatives are potential materials for electro-optical, solar energy electrochemistry and catalysis devices. In addition, the layered crystals and their intercalated derivatives serve as models for other important crystals such as superlattices and superconductors. Often, the intercalation process cause dramatic changes of the structural and electrical properties of the host lattice. We have followed these changes previously utilising photo-luminescence (PL) and Electron Spin Resonance spectroscopy (ESR). The PL spectra gave evidence for donor-acceptor and recombination emission in the nominally pure and intercalated crystals. This paper describes the utilisation of Optically Detected Magnetic Resonance (ODMR) for the characterisation of the donors and the acceptors sites. This method have an advantage over the previously applied method in correlating structural and electronic properties.

Keywords: electron spin resonance spectroscopy; ESR; optically detected magnetic resonance; ODMR; photoluminescence; recombination emission; layered semiconductors; semiconducting transition metals; chalcogenophosphate; intercalating compounds; layered crystals.

DOI: 10.1504/IJMPT.1996.036325

International Journal of Materials and Product Technology, 1996 Vol.11 No.1/2, pp.159 - 165

Published online: 02 Nov 2010 *

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