ODMR studies of recombination emission in MPS₃ layered semiconductors and their intercalation derivatives
by E. Lifshitz, A.H. Francis
International Journal of Materials and Product Technology (IJMPT), Vol. 11, No. 1/2, 1996

Abstract: The semiconducting transition metals chalcogenophosphate (MPS₃) crystallise in a layered structure. Under appropriate conditions ions and molecules with Lewis base character can enter the space between the layers to form intercalating compounds. These layered semiconductors and their intercalation derivatives are potential materials for electro-optical, solar energy electrochemistry and catalysis devices. In addition, the layered crystals and their intercalated derivatives serve as models for other important crystals such as superlattices and superconductors. Often, the intercalation process cause dramatic changes of the structural and electrical properties of the host lattice. We have followed these changes previously utilising photo-luminescence (PL) and Electron Spin Resonance spectroscopy (ESR). The PL spectra gave evidence for donor-acceptor and recombination emission in the nominally pure and intercalated crystals. This paper describes the utilisation of Optically Detected Magnetic Resonance (ODMR) for the characterisation of the donors and the acceptors sites. This method have an advantage over the previously applied method in correlating structural and electronic properties.

Online publication date: Tue, 02-Nov-2010

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