Title: Computed tomography – new and promising chances in manufacturing metrology

Authors: Albert Weckenmann, Philipp Kramer

Addresses: Chair Quality Management and Manufacturing Metrology, University Erlangen-Nuremberg, Naegelsbachstr, 25, 91052 Erlangen, Germany. ' Chair Quality Management and Manufacturing Metrology, University Erlangen-Nuremberg, Naegelsbachstr, 25, 91052 Erlangen, Germany

Abstract: As a new technology, X-ray computed tomography offers new and promising possibilities in manufacturing metrology in comparison to conventional tactile or even optical measurements. The main benefit is the volumetric model which results of each measurement and represents the measurement object holistically with high point density.

Keywords: manufacturing metrology; X-ray computed tomography; coordinate measuring.

DOI: 10.1504/IJPTECH.2010.031655

International Journal of Precision Technology, 2010 Vol.1 No.3/4, pp.223 - 233

Published online: 16 Feb 2010 *

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