Computed tomography – new and promising chances in manufacturing metrology
by Albert Weckenmann, Philipp Kramer
International Journal of Precision Technology (IJPTECH), Vol. 1, No. 3/4, 2010

Abstract: As a new technology, X-ray computed tomography offers new and promising possibilities in manufacturing metrology in comparison to conventional tactile or even optical measurements. The main benefit is the volumetric model which results of each measurement and represents the measurement object holistically with high point density.

Online publication date: Tue, 16-Feb-2010

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