Title: Distinct element modelling of the material removal process in conventional and Laser Assisted Machining of silicon nitride ceramics

Authors: Budong Yang, Xinwei Shen, Shuting Lei

Addresses: Department of Industrial and Manufacturing Systems Engineering, Kansas State University, Manhattan KS 66506, USA. ' Department of Industrial and Manufacturing Systems Engineering, Kansas State University, Manhattan KS 66506, USA. ' Department of Industrial and Manufacturing Systems Engineering, Kansas State University, Manhattan KS 66506, USA

Abstract: This paper applies distinct element method (DEM) to simulate the material removal in conventional and Laser Assisted Machining (LAM) of silicon nitride ceramics. Simulation results demonstrate that DEM can reproduce the initiation and propagation of cracks, chip formation process and material removal mechanisms. Material removal is mainly realised by propagation of lateral cracks in both conventional and LAM. Crushing-type material removal is an important mechanism in conventional machining but not in LAM. The lateral cracks in LAM are easier to propagate to form larger chips. LAM creates less and smaller median cracks, therefore has less surface/subsurface damage than conventional machining. [Received 14 February 2008; Revised 30 June 2008; Accepted 4 August 2008]

Keywords: DEM; distinct element method; PFC; particle flow code; material removal process; LAM; laser assisted machining; conventional machining; silicon nitride ceramics; simulation; crack initiation; crack propagation; chip formation.

DOI: 10.1504/IJMR.2009.022744

International Journal of Manufacturing Research, 2009 Vol.4 No.1, pp.74 - 94

Published online: 25 Jan 2009 *

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