Title: Nanoscratch behaviour, structure and nanoindentation of multilayer TiN/CrN coatings
Authors: Manohar S. Konchady, Sergey Yarmolenko, Devdas M. Pai, Jagannathan Sankar, Alexander V. Kvit
Addresses: Center for Advanced Materials and Smart Structures (CAMSS), North Carolina A&T State University, Greensboro, NC 27411, USA. ' Center for Advanced Materials and Smart Structures (CAMSS), North Carolina A&T State University, Greensboro, NC 27411, USA. ' Center for Advanced Materials and Smart Structures (CAMSS), North Carolina A&T State University, Greensboro, NC 27411, USA. ' Center for Advanced Materials and Smart Structures (CAMSS), North Carolina A&T State University, Greensboro, NC 27411, USA. ' University of Wisconsin – Madison, 115D Materials Science and Engineering Building, 1509 University Avenue, Madison, WI 53706-1595, USA
Abstract: The nanoscratch behaviour of TiN/CrN nanolaminates has been investigated in the present study. The critical load (LcL) during the loading process characterises the fracture resistance of the coating, whereas that during unloading (LcU), characterises the adhesion strength between the coating and the substrate. For all coatings, the nanoscratch profiles indicate three distinct regimes: elastic deformation, elastic–plastic deformation and delamination with material removal. Multilayer coatings show significantly higher critical loads than monolayer coatings. SEM characterisation indicates the cracking mechanisms are different for monolayer and multilayer coatings explaining why the multilayer coatings withstand higher critical loads.
Keywords: nanolaminates; X-ray diffraction; XTEM; nanoindentation; residual stress; nanoscratch behaviour; delamination; titanium nitride; chromium nitride; multilayer coatings; fracture resistance; adhesion strength; elastic deformation; elastic–plastic deformation; cracking mechanisms; critical loads; nanotechnology.
DOI: 10.1504/IJSURFSE.2008.022284
International Journal of Surface Science and Engineering, 2008 Vol.2 No.6, pp.439 - 456
Published online: 26 Dec 2008 *
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