Title: Six Sigma-based RS, MDSS and MDSRS control charts

Authors: Anna Zacharia; J. Ravichandran

Addresses: Department of Mathematics, Amrita School of Engineering, Coimbatore, Amrita Vishwa Vidyapeetham, India ' Department of Mathematics, Amrita School of Engineering, Coimbatore, Amrita Vishwa Vidyapeetham, India

Abstract: In this paper, well-defined Six Sigma-based repetitive sampling control charts (RSCCs) and multiple dependent state sampling control charts (MDSSCCs) are proposed. The Six Sigma-based multiple dependent state repetitive sampling control charts (MDSRSCCs) are also studied. The average run length (ARL) performance of the proposed charts are numerically evaluated and compared with the existing RSCCs, MDSSCCs and MDSRSCCs. Since the proposed charts are based on the Six Sigma methodology, these charts ensure the Six Sigma goal of 3.4 defects per million opportunities. It is observed that the proposed charts perform better than the existing ones by means of better average run lengths and also suggest minimum process disturbance for smaller shifts in the process mean. The charts are easier to apply by the quality practitioners. A numerical example is given to illustrate the better performance of the proposed control charts.

Keywords: average run length; multiple dependent state sampling; repetitive sampling; Six Sigma; zone control charts.

DOI: 10.1504/IJSSCA.2021.120576

International Journal of Six Sigma and Competitive Advantage, 2021 Vol.13 No.4, pp.435 - 455

Received: 23 Oct 2020
Accepted: 21 Mar 2021
Published online: 26 Jan 2022 *