Title: Characterisation and optimal design of a new double sampling c chart

Authors: Manuel J. Campuzano; Andrés Carrión; Jaime Mosquera

Addresses: Department of Statistics and Operations Research, Universitat de València, Valencia, Spain ' Department of Statistics and Applied Operational Research and Quality, Universitat Politècnica de València, Valencia, Spain ' School of Statistics, Universidad del Valle, Cali, Colombia

Abstract: This paper proposes a new double sampling scheme for c control chart (DS-c), which was designed to improve the performance of c chart or to reduce the inspection cost. The mathematical expression required to do an exact evaluation of ARL and ASN is deduced. Further, a bi-objective genetic algorithm is implemented to obtain the optimal design of the DS-c scheme. This optimisation is aimed to simultaneously minimising the error probability type II and the ASN, guaranteeing a desired level for the error probability type I. A performance comparison between the double sampling (DS), fixed parameters (FP), variable simple size (VSS) and exponential weighted moving average (EWMA) schemes for the c chart is carried out. The comparison shows that with the implementation of DS-c scheme is obtained a significant reduction of the out of control ARL with a lower ASN respect to FP and a better ARL profile than VSS and EWMA. [Received: 4 February 2018; Accepted: 1 February 2019]

Keywords: statistical process control; number of non-conformities; c chart; double sampling; optimal design.

DOI: 10.1504/EJIE.2019.104312

European Journal of Industrial Engineering, 2019 Vol.13 No.6, pp.775 - 793

Received: 04 Feb 2018
Accepted: 01 Feb 2019

Published online: 02 Jan 2020 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article