Characterisation and optimal design of a new double sampling c chart Online publication date: Thu, 02-Jan-2020
by Manuel J. Campuzano; Andrés Carrión; Jaime Mosquera
European J. of Industrial Engineering (EJIE), Vol. 13, No. 6, 2019
Abstract: This paper proposes a new double sampling scheme for c control chart (DS-c), which was designed to improve the performance of c chart or to reduce the inspection cost. The mathematical expression required to do an exact evaluation of ARL and ASN is deduced. Further, a bi-objective genetic algorithm is implemented to obtain the optimal design of the DS-c scheme. This optimisation is aimed to simultaneously minimising the error probability type II and the ASN, guaranteeing a desired level for the error probability type I. A performance comparison between the double sampling (DS), fixed parameters (FP), variable simple size (VSS) and exponential weighted moving average (EWMA) schemes for the c chart is carried out. The comparison shows that with the implementation of DS-c scheme is obtained a significant reduction of the out of control ARL with a lower ASN respect to FP and a better ARL profile than VSS and EWMA. [Received: 4 February 2018; Accepted: 1 February 2019]
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