Special Issue on: "Advances in Metrology of Surface Topography"
J. Paulo Davim, University of Aveiro, Portugal
Over the years the characterisation and evaluation of engineering surface topography has constituted a challenging metrological problem of great interest to industry. Emerging technological advances put new limits in manufacturing tolerances and a better understanding of the tribological phenomena is of great importance to functional surface topography characterisation.
In this respect, this special issue aims to present a collection of several examples using modern techniques of surface topography. The issue will be of interest to academics and researchers; materials, manufacturing and mechanical engineers; physicists in surface analysis; and professionals in surface engineering and related industries.
Suitable topics include, but are not limited to, the following:
- Surface, micro and nanometrology
- Surface texture parameters - 2D and 3D
- Surface anisotropy
- Surface topography
- Surface measurements
- Instrumentation - novel instrumental developments
- Stylus profilometers
- Topological characterisation
- Optical methods
- Statistical tools
- Engineered surfaces
- Industrial applications
Notes for Prospective Authors
Submitted papers should not have been previously published nor be currently under consideration for publication elsewhere. (N.B. Conference papers may only be submitted if the paper has been completely re-written and if appropriate written permissions have been obtained from any copyright holders of the original paper).
All papers are refereed through a peer review process.
All papers must be submitted online. To submit a paper, please read our Submitting articles page.
Manuscripts due by: 30 June, 2017