Int. J. of Quality Engineering and Technology   »   2015 Vol.5, No.3/4



Title: GERT analysis of the deferred life test sampling plan based on gamma failure


Authors: D.K. Gangeshwer; Gauri Shankar


Department of Mathematics, Bhilai Institute of Technology, Durg, (C.G), Pin 491001, India
School of Studies in Statistics, Pt. Ravishankar Shukla University, Raipur, (C.G), Pin 492001, India


Abstract: This paper presents graphical evaluation and review technique (GERT) analysis of the deferred life test sampling plan based on gamma failure. GERT approach which has been successfully used by Ohta (1978) for studying some quality control problems. The idea of using what is known as deferred sampling plan is due to Vaerst (1980). A brief account of GERT methodology and its application in quality control has been given by Shankar (1993). The advantage of the GERT analysis in the present context is two folded. Firstly, this procedure gives a visual picture of the dynamics of the inspection system and secondly, it offers a through characterisation of the plan. The formula of operating characteristics (OC) function and average sample number (ASN) function is derived and illustrated numerically. Lastly, tables have been provided to determine the smallest sample size n necessary to assure a certain mean life or quality of the product.


Keywords: deferred life test sampling plan; graphical evaluation and review technique; GERT; operating characteristics; average sample number; ASN; gamma failure; inspection system dynamics; quality control.


DOI: 10.1504/IJQET.2015.075774


Int. J. of Quality Engineering and Technology, 2015 Vol.5, No.3/4, pp.204 - 216


Submission date: 29 May 2015
Date of acceptance: 31 Oct 2015
Available online: 04 Apr 2016



Editors Full text accessAccess for SubscribersPurchase this articleComment on this article