GERT analysis of the deferred life test sampling plan based on gamma failure
by D.K. Gangeshwer; Gauri Shankar
International Journal of Quality Engineering and Technology (IJQET), Vol. 5, No. 3/4, 2015

Abstract: This paper presents graphical evaluation and review technique (GERT) analysis of the deferred life test sampling plan based on gamma failure. GERT approach which has been successfully used by Ohta (1978) for studying some quality control problems. The idea of using what is known as deferred sampling plan is due to Vaerst (1980). A brief account of GERT methodology and its application in quality control has been given by Shankar (1993). The advantage of the GERT analysis in the present context is two folded. Firstly, this procedure gives a visual picture of the dynamics of the inspection system and secondly, it offers a through characterisation of the plan. The formula of operating characteristics (OC) function and average sample number (ASN) function is derived and illustrated numerically. Lastly, tables have been provided to determine the smallest sample size n necessary to assure a certain mean life or quality of the product.

Online publication date: Mon, 04-Apr-2016

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Quality Engineering and Technology (IJQET):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com