Int. J. of Nanomanufacturing   »   2012 Vol.8, No.5/6

 

 

Title: Scattered light sensor for chatter mark detection in nanometer scale

 

Authors: J. Seewig; M. Wendel

 

Addresses:
Institute for Measurement and Sensor-Technology, Technical University of Kaiserslautern, Postbox 3049, 67653 Kaiserslautern, Germany
Institute for Measurement and Sensor-Technology, Technical University of Kaiserslautern, Postbox 3049, 67653 Kaiserslautern, Germany

 

Abstract: The detection and analysis of chatter marks in nanometer scale, using an angle resolved scattered light sensor, is discussed in this paper. After explaining the fundamental principles of scattered light sensors, a transfer function is obtained which yields the limit of wavelength that can be detected. Afterwards two methods of detecting chatter marks are highlighted: the Gabor transform and the usage of a filter bank.

 

Keywords: scattered light sensors; chatter marks; nanotechnology; transfer function; Gabor transform; filter banks; vibration.

 

DOI: 10.1504/IJNM.2012.051106

 

Int. J. of Nanomanufacturing, 2012 Vol.8, No.5/6, pp.484 - 492

 

Submission date: 18 Dec 2011
Date of acceptance: 19 Jul 2012
Available online: 20 Dec 2012

 

 

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