Transient morphology analysis and sparse representation for bearing fault diagnosis under variable speed condition Online publication date: Fri, 13-Apr-2018
by Juanjuan Shi; Nan Wu; Xingxing Jiang; Changqing Shen; Zhongkui Zhu
International Journal of Mechatronics and Manufacturing Systems (IJMMS), Vol. 11, No. 1, 2018
Abstract: Sparse representation has been extensively applied for bearing fault diagnosis under constant speed operation. However, its application to the variable speed case is confined as, unlike the constant speed case, the fault-induced transients under variable speed are more complex and the changing pattern of transient morphology along rotating speed is uncertain. As such, this paper firstly investigates the morphology of faulty bearing vibration response to reveal that the rotating speed variations have negligible effects on morphology of the fault-induced transients. Then an efficient dictionary spanned by a single atom can be constructed, where the optimal wavelet atom is selected by the correlation filtering strategy. The stage-wise orthogonal matching pursuit (StOMP) is subsequently adopted to enable the target signal to be sparsely represented and fast reconstructed. By analysing the characteristic order extracted from the reconstructed signal, the fault diagnosis can be completed. The experimental signals validate the effectiveness of the proposed method.
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Mechatronics and Manufacturing Systems (IJMMS):
Login with your Inderscience username and password:
Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.
If you still need assistance, please email subs@inderscience.com