Title: Transient morphology analysis and sparse representation for bearing fault diagnosis under variable speed condition

Authors: Juanjuan Shi; Nan Wu; Xingxing Jiang; Changqing Shen; Zhongkui Zhu

Addresses: School of Rail Transportation, Soochow University, Suzhou 213151, China ' School of Rail Transportation, Soochow University, Suzhou 213151, China ' School of Rail Transportation, Soochow University, Suzhou 213151, China ' School of Rail Transportation, Soochow University, Suzhou 213151, China ' School of Rail Transportation, Soochow University, Suzhou 213151, China

Abstract: Sparse representation has been extensively applied for bearing fault diagnosis under constant speed operation. However, its application to the variable speed case is confined as, unlike the constant speed case, the fault-induced transients under variable speed are more complex and the changing pattern of transient morphology along rotating speed is uncertain. As such, this paper firstly investigates the morphology of faulty bearing vibration response to reveal that the rotating speed variations have negligible effects on morphology of the fault-induced transients. Then an efficient dictionary spanned by a single atom can be constructed, where the optimal wavelet atom is selected by the correlation filtering strategy. The stage-wise orthogonal matching pursuit (StOMP) is subsequently adopted to enable the target signal to be sparsely represented and fast reconstructed. By analysing the characteristic order extracted from the reconstructed signal, the fault diagnosis can be completed. The experimental signals validate the effectiveness of the proposed method.

Keywords: bearing fault diagnosis; variable speed; dictionary construction; sparse representation; fault feature extraction.

DOI: 10.1504/IJMMS.2018.091174

International Journal of Mechatronics and Manufacturing Systems, 2018 Vol.11 No.1, pp.17 - 35

Received: 01 Jul 2017
Accepted: 11 Sep 2017

Published online: 11 Apr 2018 *

Full-text access for editors Access for subscribers Purchase this article Comment on this article