Determination of sample size to support diagnostic inspection of components
by Eishiro Higo; Mahesh D. Pandey
International Journal of Quality Engineering and Technology (IJQET), Vol. 7, No. 2, 2018

Abstract: A complex engineering system like a nuclear power reactor consists of a large variety and number of engineering components. As a part of a component aging management program, the diagnostic inspections of various component populations are performed to detect the onset of any unanticipated degradation. A prudent selection of the inspection sample size is necessary to optimise inspection cost. Sample size selection is typically based on the traditional statistical hypothesis test, which tends to result in a fairly large sample size. This paper presents an alternate approach to the sample size determination (SSD) problem based on the concept of the value of information (VoI). The paper provides a comparative analysis of the VoI and hypothesis-testing approaches through illustrative examples. The VoI approach is shown to provide a more meaningful way to minimise the cost of inspection as a function of component-replacement cost and losses arising from a failure. The characteristics and advantages of the VoI approach are analysed.

Online publication date: Tue, 15-Jan-2019

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Quality Engineering and Technology (IJQET):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?

Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email