Design and construction of a variables multiple dependent state sampling plan based on process yield
by Chien-Wei Wu; Shih-Wen Liu; Amy H.I. Lee
European J. of Industrial Engineering (EJIE), Vol. 9, No. 6, 2015

Abstract: Acceptance sampling plans can be used in decision making for product quality control. The plans provide decision rules to the producer and the consumer for lot determination. In this paper, a new sampling plan, namely variables multiple dependent state (VMDS), is developed based on the process yield index Spk and utilises the conventional variables single sampling (VSS) plan as a reference plan. The plan parameters are solved by the optimisation problem, in which the objective function is designed to minimise the sample size and the constraints are formulated for satisfying the allowable risks given by the producer and the consumer simultaneously. The results indicate that the proposed VMDS sampling plan can provide the same projections to the producer and the consumer with smaller required sample size which compared to the conventional VSS plan. For practical applications purpose, an example taken from Li-ion battery industry is presented for illustration. [Received 25 August 2014; Revised 23 December 2014; Accepted 15 February 2015]

Online publication date: Mon, 25-Jan-2016

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