A new control chart for monitoring the event frequency and magnitude
by L. Qu; Z. Wu; M.B.C. Khoo; L.J. Shu
European J. of Industrial Engineering (EJIE), Vol. 8, No. 6, 2014

Abstract: This article presents a single statistical process control chart, the G chart, for monitoring a critical event through the simultaneously testing of the time interval T and magnitude X of the event. The G chart is not only able to make decisions based on both T and X, but is also capable to optimally allocate the detection power between that against T shifts and X shifts, and between that against small shifts and large shifts. Moreover, the G chart retains most of the advantages of the Shewhart type charts of easy design, implementation and understanding. The results of performance studies show that the G chart is much more effective than all other Shewhart charts in literature for detecting the out-of-control status of an event. The G chart can be applied to many areas, especially to non-manufacturing sectors such as supply chain management and healthcare industry. [Received 23 August 2011; Revised 11 December 2012; Revised 10 March 2013; Accepted 23 July 2013]

Online publication date: Thu, 29-Jan-2015

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the European J. of Industrial Engineering (EJIE):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?

Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com