Step-stress accelerated test
by Ming-Wei Lu, Richard J. Rudy
International Journal of Materials and Product Technology (IJMPT), Vol. 17, No. 5/6, 2002

Abstract: Most products are designed to operate for a long period of time, and in such case, life testing is a relatively lengthy procedure. Lengthy tests tend to be expensive and the result becomes available too late to be of much use. To reduce the experimental cost significantly and provide an efficient tool to assess the life distribution for highly reliable products, the Step-stress accelerated test (SSAT) was developed. An example of a SAE keyhole specimen made of RQC-100 is used to demonstrate the SSAT procedure.

Online publication date: Mon, 11-Oct-2004

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Materials and Product Technology (IJMPT):
Login with your Inderscience username and password:

Username:        Password:          Forgotten your password?

Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com