Robust face recognition using wavelet transform and autoassociative neural network
by J. Sheeba Rani, D. Devaraj, R. Sukanesh
International Journal of Biometrics (IJBM), Vol. 1, No. 2, 2008

Abstract: In this paper, an efficient face recognition system using wavelet transform (WT) and modular autoassociative neural network (AANN) is proposed. WT, which has superior feature representation capability in multiresolution space and also less sensitive to noise and variation to lighting condition, is used to extract the features. The AANN which perform identity mapping of input space is used to capture the distribution of the low resolution face data obtained from WT. To avoid over fitting, over training and small-sample effect problem, we construct separate AANN for each person. To evaluate the proposed scheme, experiments have been conducted using ORL database and Yale A database for three cases namely normal images, noisy images and occluded images. In all the three cases, the modular AANN scheme produces better recognition rate compared to PCA, LDA and kernel associative memory (KAM). In particular, the proposed method outperforms the other methods in the case of occluded images.

Online publication date: Sat, 30-Aug-2008

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Biometrics (IJBM):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?

Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email