Photoelectrochemical activity of magnetron sputtered ZnO thin films: role of thermal annealing
by M.R. Almamari; N.M. Ahmed; A.M. Holi; F.K. Yam; A.A. Al-Zahrani; M.A. Almessiere
International Journal of Nanotechnology (IJNT), Vol. 19, No. 2/3/4/5, 2022

Abstract: In this paper, the effect of annealing temperature on the properties of ZnO thin films (ZOTFs) obtained using the well-known RF magnetron sputtering technique was investigated using their photoresponse in a photoelectrochemical cell. Properties pertaining to morphology, composition, structure, and optical were examined by field emission scanning electron microscopy (FESEM), energy-dispersive X-ray spectrometer (EDX), X-ray diffraction (XRD), and ultraviolet-visible spectroscopy (UV-vis), respectively. Results from FESEM showed that the surface of the ZOTFs nanoparticles was very compact, with grain size 63.32 nm at 400°C. When compared to other temperatures, 400°C contributes to a wide surface area resulting in a significantly enhanced PEC response. The ZOTF which was prepared under 400°C of annealing temperature, exhibited the highest photocurrent density 0.034 mA cm-2 and photoconversion efficiency (0.026%).

Online publication date: Wed, 27-Jul-2022

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Nanotechnology (IJNT):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?

Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email