Article Comments

Contributions from readers on our articles are very welcome. This form will let us retrieve the current data in the database and allows us to consider your comments.

Efficient don't care filling and scan chain masking for low-power testing
Subhadip Kundu; Santanu Chattopadhyay
International Journal of Computer Aided Engineering and Technology (IJCAET), 2012 Vol.4 No.2, pp.101 - 125
18 - 7 =

Thank you for your feedback.

Return to top