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Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy
M. Dehlinger; C. Dorczynski; C. Fauquet; F. Jandard; D. Tonneau; A. Bjeoumikhov; S. Bjeoumikhova; R. Gubzhokov; A. Erko; I. Zizak; D. Pailharey; S. Ferrero; B. Dahmani
International Journal of Nanotechnology (IJNT), 2012 Vol.9 No.3/4/5/6/7, pp.460 - 470
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