Title: Orthogonal rotation invariant features for iris and periocular recognition

Authors: Bineet Kaur; Sukhwinder Singh; Jagdish Kumar

Addresses: Department of Electronics and Communication Engineering, Punjab Engineering College (Deemed to be University), Chandigarh, India ' Department of Electronics and Communication Engineering, Punjab Engineering College (Deemed to be University), Chandigarh, India ' Department of Electrical Engineering, Punjab Engineering College (Deemed to be University), Chandigarh, India

Abstract: In a non-ideal scenario, iris recognition becomes challenging due to occlusion noise by eyelashes and eyelids, specular reflections and illumination variations. This limits its applicability to be used in real-time applications. Thus, periocular recognition is used in complementary to iris recognition which refers to the region around eyes including eyelashes, eyelids and skin texture. By fusing both iris and periocular modalities, a more reliable and an accurate biometric system is attained that can be considered for high surveillance applications. The proposed techniques are based on continuous orthogonal moments: Zernike moments and polar harmonic transforms which are invariant to rotation and noise. These capture local intensity variations of the neighbourhood pixels that pertain to shape details of the periocular region and random texture pattern of the iris region. The techniques have been evaluated on iris databases: IITD v1 and UBIRIS v2 and a self-developed PEC, Chandigarh periocular database which has been created in a less constrained environment for the research community working on periocular recognition. Results demonstrate that the proposed technique gives encouraging results in comparison to the existing approaches.

Keywords: biometrics; iris recognition; orthogonal moments; polar complex exponential transform; PCET; periocular recognition; polar cosine transform; PCT; polar harmonic transform; PHT; Zernike moments; polar sine transform; PST.

DOI: 10.1504/IJBM.2019.099046

International Journal of Biometrics, 2019 Vol.11 No.2, pp.160 - 176

Received: 16 Sep 2018
Accepted: 03 Dec 2018

Published online: 21 Mar 2019 *

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