Title: Guided-wave characterisations of optical, thermal and electro-optical properties of thin film materials
Authors: L. Escoubas, F. Flory, J.J. Simon, P. Torchio
Addresses: Institut Fresnel - UMR CNRS 6133 - Ecole Generaliste d'Ingenieurs de Marseille (EGIM), Domaine Universitaire de St Jerome Nord, 13397 Marseille cedex 20, France. ' Institut Fresnel - UMR CNRS 6133 - Ecole Generaliste d'Ingenieurs de Marseille (EGIM), Domaine Universitaire de St Jerome Nord, 13397 Marseille cedex 20, France. ' Institut Fresnel - UMR CNRS 6133 - Ecole Generaliste d'Ingenieurs de Marseille (EGIM), Domaine Universitaire de St Jerome Nord, 13397 Marseille cedex 20, France. ' Institut Fresnel - UMR CNRS 6133 - Ecole Generaliste d'Ingenieurs de Marseille (EGIM), Domaine Universitaire de St Jerome Nord, 13397 Marseille cedex 20, France
Abstract: A general overview of the determination, by guided waves, of optical, anisotropic, thermal, non-linear and electro-optical properties of materials in thin film form is presented. Several set-up allowing guided wave characterisations of thin films are described. Examples of the various characterisations are discussed.
Keywords: anisotropy; electro-optical properties; m-lines; thin films; nonlinear properties; optical guided waves; optical properties; thermal properties; material properties; measurements.
DOI: 10.1504/IJMPT.2006.009476
International Journal of Materials and Product Technology, 2006 Vol.26 No.3/4, pp.372 - 387
Published online: 04 Apr 2006 *
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