Title: A new hyperchaotic temperature fluctuations model, its circuit simulation, FPGA implementation and an application to image encryption

Authors: Sundarapandian Vaidyanathan; Ahmad Taher Azar; Karthikeyan Rajagopal; Aceng Sambas; Sezgin Kacar; Unal Cavusoglu

Addresses: Research and Development Centre, Vel Tech University, Avadi, Chennai 600062, Tamil Nadu, India ' Faculty of Computers and Information, Benha University, Benha, Al Qalyubia Governorate 13511, Egypt; School of Engineering and Applied Sciences, Nile University, Sheikh Zayed District, 6th of October City, Giza, Egypt ' Center for Nonlinear Dynamics, Defence University, P.O. Box 1041, Bishoftu, Oromia Regional State, Ethiopia ' Department of Mechanical Engineering, Universitas Muhammadiyah Tasikmalaya, Indonesia ' Department of Electrical and Electronics Engineering, Sakarya University, Esentepe Campus 54187 Serdivan, Sakarya, Turkey ' Department of Computer Engineering, Sakarya University, Esentepe Campus 54187 Serdivan, Sakarya, Turkey

Abstract: In this paper, we propose a new hyperchaotic temperature fluctuations model and describe its modelling in detail. We study the characteristics of the new hyperchaotic temperature fluctuations model such as its phase portraits, rest points, symmetry, invariance, Lyapunov characteristic exponents, bifurcation analysis, etc. In fact, it is shown that the new temperature fluctuations model has a self-excited, two-scroll, hyperchaotic attractor with complex properties. The circuit simulation of the new temperature fluctuations model is carried out in MultiSim to verify the feasibility of the theoretical model. In addition, FPGA implementation of the new hyperchaotic temperature fluctuations model is also presented. An engineering application of the new hyperchaotic temperature fluctuations model for image encryption has been also described.

Keywords: hyperchaos; hyperchaotic systems; circuit design; FPGA implementation; Lyapunov exponents; image encryption.

DOI: 10.1504/IJSPM.2018.093113

International Journal of Simulation and Process Modelling, 2018 Vol.13 No.3, pp.281 - 296

Received: 04 Jan 2018
Accepted: 27 Mar 2018

Published online: 09 Jul 2018 *

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