Title: Double acceptance sampling plan based on the Burr type X distribution under truncated life tests
Authors: Wenhao Gui; Xinman Lu
Addresses: Department of Mathematics, Beijing Jiaotong University, Beijing 100044, China ' Department of Management Information System, Tianjin University of Finance and Economics, Tianjin 300222, China
Abstract: In this paper, we propose a double acceptance sampling plan for the Burr type X distribution when the lifetime experiment is truncated at a predetermined time. Considering the zero and one failure scheme, the minimum sample sizes of the first and second samples necessary to ensure the specified median life are obtained at the given consumer's confidence level. The operating characteristic values are analysed with various ratios of the true median lifetime to the specified life of the product. The minimum ratios of the median life to the specified life are also presented. We illustrate the double acceptance sampling plan with a numerical example.
Keywords: double acceptance sampling plan; producer's risk; truncated life test; Burr type X distribution; operating characteristic function value.
International Journal of Industrial and Systems Engineering, 2018 Vol.28 No.3, pp.319 - 330
Received: 13 Apr 2015
Accepted: 14 Feb 2016
Published online: 09 Feb 2018 *