Title: Performance benchmarking of tunnel transistors for energy efficient 4-bit adder architectures at low VDD
Authors: Sadulla Shaik; K. Sri Rama Krishna
Addresses: Department of Electronics and Communication Engineering, Vignan's Foundation for Science, Technology and Research University, Vadlamudi 522213, A.P., India ' Department of Electronics and Communication Engineering, Velagapudi Ramakrishna Siddhartha Engineering College, Vijayawada 520007, A.P., India
Abstract: Tunnel field-effect transistors (TFETs) have emerged as one of the most promising post-CMOS transistor technologies. This paper presents design analysis and benchmarking of TFET based three different 1-bit full adders (8T-XOR Logic, 6T-XOR Logic and MUX Based) are used for designing 4-bit adders in two different topologies targeting a VDD below 500 mV. These topologies are 22T/18T 1-bit full adder based 4-bit carry propagate adder (22T/18TCPA) and multiplexer logic 1-bit full adder based 4-bit carry propagate adder (MCPA). The performance of TFET based 4-bit adder topologies has been benchmarked with 20 nm double gate Si FinFET technology. Tunnel FETs are desirable candidates for building energy efficient and reliable arithmetic blocks with supply voltage scaling. We demonstrate that TFET's steep slope characteristics enable the 22TCPA design to be energy efficient option along with improved reliability and 18TCPA design is the best in terms of energy efficiency and reliability amongst all designs at low supply voltages.
Keywords: double gate FinFETs; energy efficient computing; high speed 1-bit and 4-bit adders; reliability; steep slope devices; tunnel FETs; ultra low power; XOR gates.
Electronic Government, an International Journal, 2017 Vol.13 No.4, pp.356 - 376
Received: 24 Dec 2016
Accepted: 23 Mar 2017
Published online: 04 Nov 2017 *