Title: Machining performance optimisation during EDM of Inconel 718: a case experimental investigation

Authors: Rahul; Kumar Abhishek; Saurav Datta; Bibhuti Bhusan Biswal; Siba Sankar Mahapatra

Addresses: Department of Industrial Design, National Institute of Technology, Rourkela 769008, Odisha, India ' Department of Mechanical Engineering, FST, IFHE, Hyderabad 500082, India ' Department of Mechanical Engineering, National Institute of Technology, Rourkela 769008, Odisha, India ' Department of Industrial Design, National Institute of Technology, Rourkela 769008, Odisha, India ' Department of Mechanical Engineering, National Institute of Technology, Rourkela 769008, Odisha, India

Abstract: Machining performance during electro discharge machining (EDM) on Inconel 718 has been experimentally investigated. Based on six factor-three level L27 orthogonal array design of experiment, machining responses in terms of material removal rate, tool wear rate, roughness average and surface crack density of the EDMed work surface have been studied by varying controllable process parameters viz. gap voltage, peak current, pulse-on time, duty factor, flushing pressure, etc. along with three different electrode tools made of brass, graphite and copper, respectively. The work aimed at determining the most favourable setting of controllable process parameters along with a particular tool electrode to satisfy conflicting requirements of multi-performance yields. An integrated optimisation route, i.e., principal component analysis (PCA), fuzzy inference system (FIS) in conjugation with Taguchi method has been attempted herein.

Keywords: electro discharge machining; EDM; Inconel 718; principal component analysis; PCA; fuzzy inference system; FIS; Taguchi method.

DOI: 10.1504/IJPQM.2017.085255

International Journal of Productivity and Quality Management, 2017 Vol.21 No.4, pp.460 - 489

Received: 07 Apr 2016
Accepted: 15 May 2016

Published online: 22 Jun 2017 *

Full-text access for editors Access for subscribers Purchase this article Comment on this article