Title: Tight lower bounds for MPSK Nakagami-m systems with phase error

Authors: Mahmoud A. Smadi

Addresses: Department of Electrical Engineering, Hashemite University, Zarqa 13115, Jordan

Abstract: In this paper, we derive very tight lower bounds for the average bit error probability (BEP) of M-ary phase shift keying (MPSK) systems. For the first time, the bounds are obtained taking into consideration Nakagami-m wireless fading channel and Tikhonov-distributed carrier phase error. The bounds are shown to be tight and easy to evaluate for phase error noise parameters likely to be encountered in practice and for signal-to-noise ratio (SNR) that are needed in moderate fading environment. The accuracy of the derived bounds is illustrated by comparing the bound results to those obtained by exact solutions for M = 2 and M = 4.

Keywords: M-ary phase shift keying; MPSK; phase error; Nakagami-m fading.

DOI: 10.1504/IJSCC.2017.083981

International Journal of Systems, Control and Communications, 2017 Vol.8 No.2, pp.125 - 131

Accepted: 25 Nov 2016
Published online: 30 Apr 2017 *

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