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Title: A general boundary scan test system based on EDIF netlist file transfer to Protel netlist file

Authors: Shouhong Chen; Zhuang Wang; Xingna Hou; Xuelong Yan; Ping Yang

Addresses: Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin 541004, China; Laboratory of Advanced Design, Manufacturing & Reliability for MEMS/NEMS/ODES, School of Mechanical Engineering, Jiangsu University, Zhenjiang 212013, China ' Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin 541004, China ' Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin 541004, China ' Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin 541004, China ' Laboratory of Advanced Design, Manufacturing & Reliability for MEMS/NEMS/ODES, School of Mechanical Engineering, Jiangsu University, Zhenjiang 212013, China

Abstract: Boundary scan test technology provides a powerful means to solve the difficult problem of high density integrated test system components. It introduces the development of a more general boundary scan test system based on electronic design interchange format (EDIF) and Protel netlist which can transfer EDIF netlist file to Protel netlist file. According to the characteristics of EDIF netlist file and Protel netlist file, the design and implementation of a compiler to transfer EDIF to Protel netlist file is presented. The compiler uses Flex and Bison to deal with EDIF files for lexical and syntax checking, error handling, and then according to the rules of Protel it generates the Protel netlist file. The test system can achieve the test and fault diagnosis.

Keywords: boundary scan test; Flex and Bison; electronic design interchange format; EDIF; Protel netlist; file transfer; compiler design; fault diagnosis; high density test system components.

DOI: 10.1504/IJMSI.2016.079641

International Journal of Materials and Structural Integrity, 2016 Vol.10 No.1/2/3, pp.70 - 80

Available online: 05 Oct 2016 *

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