Title: GERT analysis of the deferred life test sampling plan based on gamma failure

Authors: D.K. Gangeshwer; Gauri Shankar

Addresses: Department of Mathematics, Bhilai Institute of Technology, Durg, (C.G), Pin 491001, India ' School of Studies in Statistics, Pt. Ravishankar Shukla University, Raipur, (C.G), Pin 492001, India

Abstract: This paper presents graphical evaluation and review technique (GERT) analysis of the deferred life test sampling plan based on gamma failure. GERT approach which has been successfully used by Ohta (1978) for studying some quality control problems. The idea of using what is known as deferred sampling plan is due to Vaerst (1980). A brief account of GERT methodology and its application in quality control has been given by Shankar (1993). The advantage of the GERT analysis in the present context is two folded. Firstly, this procedure gives a visual picture of the dynamics of the inspection system and secondly, it offers a through characterisation of the plan. The formula of operating characteristics (OC) function and average sample number (ASN) function is derived and illustrated numerically. Lastly, tables have been provided to determine the smallest sample size n necessary to assure a certain mean life or quality of the product.

Keywords: deferred life test sampling plan; graphical evaluation and review technique; GERT; operating characteristics; average sample number; ASN; gamma failure; inspection system dynamics; quality control.

DOI: 10.1504/IJQET.2015.075774

International Journal of Quality Engineering and Technology, 2015 Vol.5 No.3/4, pp.204 - 216

Received: 29 May 2015
Accepted: 31 Oct 2015

Published online: 04 Apr 2016 *

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