Title: Reliability evaluation of transmission expansion planning using heuristic methods

Authors: G. Srinivasulu; B. Subramanyam; M. Surya Kalavathi

Addresses: Narayana Engineering College, Muthukur Road, Nellore, AP, 524004, India ' KL University, NH 5, Vaddeswaram, Vijayawada, AP, 522502, India ' JNTUH, Kukatpally, Hyderabad, Telangana, 500085, India

Abstract: Transmission expansion planning (TEP) requires coordinated and analytical analysis of various scenarios to meet the ever increasing load. In this work, TEP is for N-1 and N-2 contingencies. The scenarios considered include single line outage, double line outages, generator outage or a combination of the above. Factors like hike in load demand or hike in both generation and load are also considered for analysis. Heuristic methods like backward search (BS), forward search (FS) and hybrid search (HS) techniques used to the above scenarios to provide a prospective TEP. The proposed method is tested using a Garver test system (GTS). DC load flow analysis is used to analyse line flows. Length of new lines added, cost of new lines added and time required for simulation are calculated and compared for various scenarios. Reliability measures like voltage profile index (PI), line loading index (LI), expected energy not supplied (EENS) index, expected demand not supplied (EDNS) and probability of load curtailment (PLC) are calculated after TEP for load growth of 30% with single line outage.

Keywords: transmission expansion planning; TEP; backward search; forward search; hybrid search; N-1 contingency; N-2 contingency; GTS; Garver test system; reliability evaluation; heuristics; line outages; DC load flow analysis; voltage profile index; line loading index; expected energy not supplied; EENS index; expected demand not supplied; load curtailment probability.

DOI: 10.1504/IJPEC.2016.075063

International Journal of Power and Energy Conversion, 2016 Vol.7 No.1, pp.1 - 20

Received: 24 May 2013
Accepted: 12 Feb 2014

Published online: 02 Mar 2016 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article