Title: A simplified model of a reinforced square hollow section T-joint for stress evaluation in bus superstructures
Authors: T. Vichiensamuth; M. Pimsarn; K. Takahashi; T. Tantanawat
Addresses: International College, King Mongkut's Institute of Technology Ladkrabang, Bangkok 10520, Thailand ' Department of Mechanical Engineering, King Mongkut's Institute of Technology Ladkrabang, Bangkok 10520, Thailand ' International Development Engineering, Graduate School of Science and Engineering, Tokyo Institute of Technology, Tokyo 10520, Japan ' National Metal and Materials Technology Center, National Science and Technology Development Agency, Pathumthani 12120, Thailand
Abstract: This study aims to create a simplified model of a reinforced square hollow section (SHS) T-joint found in bus superstructures. The approach is to use a combination of one- and two-dimensional finite element models to represent a reference three-dimensional finite element model of the joint and determine stress correction factors as functions of the geometrical variables of the joint. This approach requires the stiffness of the simplified model to be equivalent to that of the reference model. By using a stiffness error function and a three-factor design of experiment (DOE), the best of four trial models, with minimum average stiffness error, was identified. The stress correction factors were then determined under static in-plane bending loads. A polynomial regression model was used to construct the relationship between the stress correction factors and the thickness-to-width ratios of the joint. The correlation coefficient of 0.9845 indicated a strong relationship and the t score confirmed its significance.
Keywords: reinforced SHS T-joints; square hollow section T-joints; finite element method; FEM; stiffness; stress correction factor; modelling; bus superstructures; design of experiments; DOE; bending loads; buses.
International Journal of Computer Applications in Technology, 2015 Vol.52 No.4, pp.228 - 236
Published online: 13 Dec 2015 *Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article